Jacob Abraham, professor of electrical and computer engineering, received the Best Paper Award at the 24th Institute of Electrical and Electronics Engineers’ Very-Large Scale Integration Test Symposium. The paper “Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits,” written by Abraham and graduate students Hongjoong Shin and Byoungho Kim, discusses problem-solving methods for testing mixed-signal circuits. Abraham holds the Cockrell Family Regents Chair in Engineering No. 8.
Oct 03, 2007
Engineer receives best paper award
Jacob Abraham, professor of electrical and computer engineering, received the Best Paper Award at the 24th Institute of Electrical and Electronics Engineers’ Very-Large Scale Integration Test Symposium.
